Match!是一个易用的软件，从粉末衍射数据中鉴定相位，这几乎是材料科学家每天的工作。Match!作为参考数据库，我们推荐您应用ICDD PDF-2 or PDF-4 databases.除了这个您还可以以您自己的衍射样品建立自己的用户数据库，这个用户的样品数据库可以通过手动的编辑，通过峰型文件输入，或者是通过晶体结构数据来计算，也可以加入你同事的数据为你所用，同样的数据不需要再一次的输入。
- Runs on Mac, Linux and of course Windows
No matter which one of these operating systems you prefer, Match! will run on it. Of course, you can use document files created with Match! on one platform on any other platform as well.
- Display and compare multiple diffraction patterns
Additional experimental patterns can now be imported and displayed on top of each other, so that you can compare them to the main experimental pattern.
- Directly view specific phases/entries
You already know that a certain phase is present in the sample, or you would like to check how some compound compares to the experimental diffraction pattern? That's pretty easy with the new version!
- Instant usage of additional information
Additional information about the sample like elements that may be or must not be present, the density etc. can now be applied much easier than in the previous version.
- Saving of selection criteria
Once you have entered a set of selection criteria (e.g. elements, density etc.) that best suits your requirements, you can save it using an appropriate name, and recall it later on with just two mouse clicks.
- Comfortable definition of background
Simply insert, shift or delete control points in the automatically calculated background curve using the mouse, in order to precisely define the background with regard to the raw data.
- Improved zooming facilities
Zoom now also implies zooming on the intensity (and not only on 2theta) axis. In addition, you can now simply use the mouse pointer and wheel to zoom into the area of interest. Of course, it is also possible to zoom to an exactly defined area (2theta/intensity).
- Batch Processing and Automatics
You are a beginner or an expert user? As you like it: Simply adjust your skill level, in order to either give you full control at each single step, let Match! run the complete phase identification automatically, or anything in between.
- Rietveld refinement using FullProf (not yet in very first version 2.0)
With just two mouse clicks, you can easily transfer your data (e.g. resulting from a phase identification) to the FullProf software and run a Rietveld refinement.
This feature is not present yet in the very first version 2.0 but will be implemented in a later version 2.x.
- Fast single and multiple phase identification from powder diffraction data
- Use free-of-charge reference patterns calculated from the COD (incl. I/Ic), any ICDD PDF database, any ICSD/Retrieve version (released 1993-2002; valid licence required) and/or your own diffraction data (or patterns calculated from crystal structure data (e.g. CIF files)) in phase identification
- Flexible handling of reference databases (incl. user databases); you can easily switch between different reference databases without the necessity to perform a new database indexation
- Create reference databases for X-ray and neutron diffraction e.g. from cif-files
- Comfortable user database manager for easy maintenance of user data (add/import/edit/delete/sort entries)
- Powerful CIF- and ICSD/Retrieve import, incl. calculation of powder pattern, I/Ic and density
- Atomic coordinates available e.g. in the ICSD, the ICDD PDF-4+ or free-of-charge reference data are displayed in the data sheets and included in the CIF- or Textfile-exports (e.g. for Rietveld analysis)
- Displaying of Miller indices (hkl) in diffraction patterns and entry data sheets
- Fully integrated handling of your own diffraction data with PDF data (search-match, retrieval, data viewing)
- Automatic residual searching with respect to identified phases
- Automatic raw data processing: α2-stripping, background subtraction, peak search, profile fitting, error correction
- Automatic optimization of peak searching sensitivity
- Fitting of all (or selected) peak parameters to exp. profile data
- Comfortable manual editing of peaks (add/shift/delete/fit) using mouse or keyboard
- Semi-quantitative analysis (Reference Intensity Ratio method)
- Straight-forward usage of additional knowledge (composition, PDF subfiles, crystallographic data, color, density etc.)
- Integrated database retrieval system and viewer for PDF, COD and user databases
- Multiple step undo/redo
- User-configurable automatic operation
- Automatic d-value shifting during search-match process (optionally)
- Intensity contribution to figure-of-merit can be reduced for preferred-orientation cases
- Comfortable graphical and tabular comparison of peak data and candidate patterns
- User-configurable reports (HTML, PDF or text file)
- Online update (automatic or manual)
- ASCII profile (start, step, intensities or 2 columns)
- Bruker/Siemens raw data (old and new) (*.raw)
- Bruker/Siemens DIFFRAC AT peak data (*.dif)
- DBWS (*.rfl, *.dat)
- ENDEAVOUR peak list (2 columns: 2theta/d intensity; *.dif)
- G670 raw data (*.gdf)
- Inel raw data (*.dat)
- Ital Structures raw data (*.esg)
- Jade/MDI/SCINTAG raw data (*.mdi)
- JEOL ASCII Export raw data (*.txt)
- PANalytical XRDML Scan raw data (*.xrdml)
- PANalytical/Philips peak data (*.udi)
- PANalytical/Philips raw data (*.rd, *.udf)
- Rigaku raw data (*.raw)
- SCINTAG raw data (*.raw, *.rd)
- Shimadzu raw data (*.raw)
- Siemens (*.uxd)
- Sietronics XRD scan data (*.cpi)
- Stoe raw data (*.raw)
- Stoe peak data (*.pks)